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簡要描述：硫化鍺晶體 GeS(Germanium Sulfide)晶體尺寸：~10毫米電學(xué)性能：半導(dǎo)體晶體結(jié)構(gòu)：斜方晶系晶胞參數(shù)：a = 1.450, b = 0.364 nm, c = 0.430 nm, α = β = γ = 90°晶體類型：合成晶體純度：＞99.995%
更新時(shí)間：2024-06-02產(chǎn)品型號： 廠商性質(zhì)：生產(chǎn)廠家訪 問 量：1962詳細(xì)介紹
硫化鍺晶體 GeS(Germanium Sulfide)
晶體尺寸：~10毫米
電學(xué)性能：半導(dǎo)體
晶體結(jié)構(gòu)：斜方晶系
晶胞參數(shù)：a = 1.450, b = 0.364 nm, c = 0.430 nm, α = β = γ = 90°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a single crystal GeS aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (h00) with h = 2, 4, 6, 8
Powder X-ray diffraction (XRD) of a single crystal GeS. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal GeS by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal GeS. Measurement was performed with a 785 nm Raman system at room temperature.
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